Structural studies on TlInSe2 thermoelectric material by X-ray fluorescence holography, XAFS, and X-ray diffraction

Shinya Hosokawa, Kenji Kamimura, Hiroyuki Ikemoto, Naohisa Happo, Kojiro Mimura, Kouichi Hayashi, Kohki Takahashi, Kazuki Wakita, Nazim Mamedov

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

The local structure around the Tl atoms in TlInSe2 thermoelectric material was investigated by X-ray fluorescence holography (XFH), XAFS, and X-ray diffraction (XD). The temperature dependent XAFS and XD data reveal that no distinct phase change features are found, and the position of the Tl atoms are fluctuated randomly in the Tl chain direction of the crystal, which is consistent with the XFH result at room temperature. Also, an interference between the positions of Tl and In atoms is suggested by all of these experiments.

Original languageEnglish
Pages (from-to)1225-1229
Number of pages5
JournalPhysica Status Solidi (B) Basic Research
Volume252
Issue number6
DOIs
Publication statusPublished - 2015 Jun 1

Keywords

  • Intermediate range
  • Local structure
  • Positional fluctuations
  • Thermoelectric material

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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