Structural model for the negative electron affinity surface of O/Cs/Si(001)2×1

Tadashi Abukawa, Shozo Kono, Tsunenori Sakamoto

Research output: Contribution to journalArticle

38 Citations (Scopus)

Abstract

A wide-terrace single-domain Si(001)2×1 surface has been used to prepare a single-domain Si(001)2×1-Cs surface and a negative electron affinity (NEA) surface of single-domain O/Cs/Si(001)2×1. An X-ray photoelectron diffraction study has reinforced the reliability of a Cs double-layer model for the Si(001)2×1-Cs surface. X-ray photoelectron diffraction for the NEA surface has revealed that the Cs double-layer is preserved and adsorption of oxygen takes place in a hollow site on a level that is coplanar with the lower Cs layer.

Original languageEnglish
Pages (from-to)L303-L305
JournalJapanese journal of applied physics
Volume28
Issue number2 A
DOIs
Publication statusPublished - 1989 Feb

Keywords

  • Cs adsorption
  • Interface
  • Negative electron affinity
  • Oxygen adsorption
  • Photoelectron spectroscopy
  • Si(001)
  • Single domain
  • Solid surface
  • X-ray photoelectron diffraction

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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