Structural evaluation of epitaxially grown organic evaporated films by total reflection x-ray diffractometer

Kenji Ishida, Kouichi Hayashi, Yuji Yoshida, Toshihisa Horiuchi, Kazumi Matsushige

Research output: Contribution to journalArticlepeer-review

35 Citations (Scopus)

Abstract

An in-plane-type total reflection x-ray diffractometer was newly constructed, and the epitaxial growth of paraffin molecules (n-C 33H68) vacuum-evaporated onto a KCl (001) surface was investigated. The molecular chains in as-evaporated films were shown to arrange themselves parallel to the 〈110〉 direction of the KCl substrate. After the evaporation, moreover, some molecules were revealed to reorient and tend to deviate their c axis by about ±5°from the 〈110〉 direction of the KCl crystal, probably because of the lattice mismatchings between the paraffin and substrate crystals.

Original languageEnglish
Pages (from-to)7338-7343
Number of pages6
JournalJournal of Applied Physics
Volume73
Issue number11
DOIs
Publication statusPublished - 1993
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Fingerprint

Dive into the research topics of 'Structural evaluation of epitaxially grown organic evaporated films by total reflection x-ray diffractometer'. Together they form a unique fingerprint.

Cite this