Structural characterization of the Fddd phase in a diblock copolymer thin film by electron microtomography

Jueun Jung, Hae Woong Park, Junyoung Lee, Haiying Huang, Taihyun Chang, Yecheol Rho, Moonhor Ree, Hidekazu Sugimori, Hiroshi Jinnai

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

A 3-dimensional Fddd network structure of a polystyrene-block-polyisoprene (PS-b-PI) diblock copolymer (M n = 31500, f PI = 0.645) was observed for the first time in real space by transmission electron microtomography (TEMT). In a 650 nm thick film of the PS-b-PI thin film on a silicon wafer, the Fddd phase was developed after annealing at 215 °C for 24 h. The single network structure consists of the connected tripodal units of minor PS block domains. The {111} Fddd plane, the densest plane of the minor PS phase, was found to orient parallel to the film plane. The transitional structure from the wetting layer at the free surface to the internal {111} Fddd plane via a perforated layer structure was also observed.

Original languageEnglish
Pages (from-to)10424-10428
Number of pages5
JournalSoft Matter
Volume7
Issue number21
DOIs
Publication statusPublished - 2011 Nov 7
Externally publishedYes

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics

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  • Cite this

    Jung, J., Park, H. W., Lee, J., Huang, H., Chang, T., Rho, Y., Ree, M., Sugimori, H., & Jinnai, H. (2011). Structural characterization of the Fddd phase in a diblock copolymer thin film by electron microtomography. Soft Matter, 7(21), 10424-10428. https://doi.org/10.1039/c1sm06236k