Structural Characterization of Non-Crystalline Oxides by the Anomalous X-ray Scattering (AXS) Method

Yoshio Waseda, Kazumasa Sugiyama

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The fundamentals of the anomalous X-ray scattering (AXS) method for materials characterization have been described by focusing our attention on the structure of non-crystalline oxide systems. This relatively new method makes it possible to provide the environmental structure around a specific element, which is not obtained from the conventional X-ray diffraction results, in multi-component non-crystalline systems. The validity and usefulness of the AXS method were demonstrated by obtaining the fine structure of GeO2 glass, ZrO2 amorphous, the Sr-La-Mn-B-O type ferromagnetic glass and the Cu-I-Mo-O type super-ionic conducting glass.

Original languageEnglish
Pages (from-to)103-121
Number of pages19
JournalHigh Temperature Materials and Processes
Volume22
Issue number2
DOIs
Publication statusPublished - 2003 Jan 1
Externally publishedYes

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Physical and Theoretical Chemistry

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