Structural and magnetic properties of Mn_2.5Ga films

In this work polycrystalline and epitaxial Mn_2.5Ga films were prepared by dc magnetron sputtering technique. The lower sputtering power and higher annealing temperature are found to be beneficial for increasing ratio of DO₂₂ phase in the polycrystalline Mn_2.5Ga films, leading to the improved magnetic properties although perpendicular magnetic anisotropy (PMA) properties cannot be observed. On the contrary, (001)-oriented epitaxial Mn_2.5Ga films grown on Cr buffered MgO substrates possess low saturation magnetization and giant PMA properties simultaneously.