Abstract
Multi-layer films of MgO20 nm/(FePt-B x)50 nm/MgO20 nm were deposited on Si (100) substrates by RF magnetron sputtering. The B content (x) of the thin films was found to be about 5 and 33 at.% by using wavelength dispersive spectroscopy (WDX). In the (FePt)0.67B0.33 film an excess of B in the FePt film led to an amorphous structure in the as-deposited film, which changed to an ordered cubic structure on annealing. However, the (FePt)0.95B0.05 film started to show a phase transformation from the disordered fee structure to the ordered L10 phase with an fct structure at 350 °C and was remarkably transformed to a L10 structure at about 500 °C on post-annealing. The maximum coercivities (Hc) of the (FePt)0.95B0.05 and the (FePt) 0.67B0.33 films were found to be ∼9.1 and 2.9 kOe after annealing at 600 °C for 1 hr, respectively.
Original language | English |
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Pages (from-to) | 1034-1036 |
Number of pages | 3 |
Journal | Journal of the Korean Physical Society |
Volume | 49 |
Issue number | 3 |
Publication status | Published - 2006 Sep 1 |
Keywords
- Boron
- Fct structure
- FePt film
- L1 phase
- Ordering
ASJC Scopus subject areas
- Physics and Astronomy(all)