Structural and magnetic properties in annealed FePt-Bx (x = 0.05 and 0.33) thin films

Y. M. Lee; B. S. Lee; C. G. Lee; B. H. Koo; Y. Shimada; Osamu Kitakami; Satoshi Okamoto; T. Miyazaki

Structural and magnetic properties in annealed FePt-B_x (x = 0.05 and 0.33) thin films

Y. M. Lee, B. S. Lee, C. G. Lee, B. H. Koo, Y. Shimada, Osamu Kitakami, Satoshi Okamoto, T. Miyazaki

Division of Inorganic Material Research

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

Multi-layer films of MgO₂₀ _nm/(FePt-B _x)₅₀ _nm/MgO₂₀ _nm were deposited on Si (100) substrates by RF magnetron sputtering. The B content (x) of the thin films was found to be about 5 and 33 at.% by using wavelength dispersive spectroscopy (WDX). In the (FePt)_0.67B_0.33 film an excess of B in the FePt film led to an amorphous structure in the as-deposited film, which changed to an ordered cubic structure on annealing. However, the (FePt)_0.95B_0.05 film started to show a phase transformation from the disordered fee structure to the ordered L10 phase with an fct structure at 350 °C and was remarkably transformed to a L10 structure at about 500 °C on post-annealing. The maximum coercivities (H_c) of the (FePt)_0.95B_0.05 and the (FePt) _0.67B_0.33 films were found to be ∼9.1 and 2.9 kOe after annealing at 600 °C for 1 hr, respectively.

Original language	English
Pages (from-to)	1034-1036
Number of pages	3
Journal	Journal of the Korean Physical Society
Volume	49
Issue number	3
Publication status	Published - 2006 Sep 1

Keywords

Boron
Fct structure
FePt film
L1 phase
Ordering

ASJC Scopus subject areas

Physics and Astronomy(all)

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title = "Structural and magnetic properties in annealed FePt-Bx (x = 0.05 and 0.33) thin films",

abstract = "Multi-layer films of MgO20 nm/(FePt-B x)50 nm/MgO20 nm were deposited on Si (100) substrates by RF magnetron sputtering. The B content (x) of the thin films was found to be about 5 and 33 at.% by using wavelength dispersive spectroscopy (WDX). In the (FePt)0.67B0.33 film an excess of B in the FePt film led to an amorphous structure in the as-deposited film, which changed to an ordered cubic structure on annealing. However, the (FePt)0.95B0.05 film started to show a phase transformation from the disordered fee structure to the ordered L10 phase with an fct structure at 350 °C and was remarkably transformed to a L10 structure at about 500 °C on post-annealing. The maximum coercivities (Hc) of the (FePt)0.95B0.05 and the (FePt) 0.67B0.33 films were found to be ∼9.1 and 2.9 kOe after annealing at 600 °C for 1 hr, respectively.",

keywords = "Boron, Fct structure, FePt film, L1 phase, Ordering",

author = "Lee, {Y. M.} and Lee, {B. S.} and Lee, {C. G.} and Koo, {B. H.} and Y. Shimada and Osamu Kitakami and Satoshi Okamoto and T. Miyazaki",

year = "2006",

month = sep,

day = "1",

language = "English",

volume = "49",

pages = "1034--1036",

journal = "Journal of the Korean Physical Society",

issn = "0374-4884",

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TY - JOUR

T1 - Structural and magnetic properties in annealed FePt-Bx (x = 0.05 and 0.33) thin films

AU - Lee, Y. M.

AU - Lee, B. S.

AU - Lee, C. G.

AU - Koo, B. H.

AU - Shimada, Y.

AU - Kitakami, Osamu

AU - Okamoto, Satoshi

AU - Miyazaki, T.

PY - 2006/9/1

Y1 - 2006/9/1

N2 - Multi-layer films of MgO20 nm/(FePt-B x)50 nm/MgO20 nm were deposited on Si (100) substrates by RF magnetron sputtering. The B content (x) of the thin films was found to be about 5 and 33 at.% by using wavelength dispersive spectroscopy (WDX). In the (FePt)0.67B0.33 film an excess of B in the FePt film led to an amorphous structure in the as-deposited film, which changed to an ordered cubic structure on annealing. However, the (FePt)0.95B0.05 film started to show a phase transformation from the disordered fee structure to the ordered L10 phase with an fct structure at 350 °C and was remarkably transformed to a L10 structure at about 500 °C on post-annealing. The maximum coercivities (Hc) of the (FePt)0.95B0.05 and the (FePt) 0.67B0.33 films were found to be ∼9.1 and 2.9 kOe after annealing at 600 °C for 1 hr, respectively.

AB - Multi-layer films of MgO20 nm/(FePt-B x)50 nm/MgO20 nm were deposited on Si (100) substrates by RF magnetron sputtering. The B content (x) of the thin films was found to be about 5 and 33 at.% by using wavelength dispersive spectroscopy (WDX). In the (FePt)0.67B0.33 film an excess of B in the FePt film led to an amorphous structure in the as-deposited film, which changed to an ordered cubic structure on annealing. However, the (FePt)0.95B0.05 film started to show a phase transformation from the disordered fee structure to the ordered L10 phase with an fct structure at 350 °C and was remarkably transformed to a L10 structure at about 500 °C on post-annealing. The maximum coercivities (Hc) of the (FePt)0.95B0.05 and the (FePt) 0.67B0.33 films were found to be ∼9.1 and 2.9 kOe after annealing at 600 °C for 1 hr, respectively.

KW - Boron

KW - Fct structure

KW - FePt film

KW - L1 phase

KW - Ordering

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