Structural and magnetic properties in annealed FePt-Bx (x = 0.05 and 0.33) thin films

Y. M. Lee, B. S. Lee, C. G. Lee, B. H. Koo, Y. Shimada, Osamu Kitakami, Satoshi Okamoto, T. Miyazaki

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)


Multi-layer films of MgO20 nm/(FePt-B x)50 nm/MgO20 nm were deposited on Si (100) substrates by RF magnetron sputtering. The B content (x) of the thin films was found to be about 5 and 33 at.% by using wavelength dispersive spectroscopy (WDX). In the (FePt)0.67B0.33 film an excess of B in the FePt film led to an amorphous structure in the as-deposited film, which changed to an ordered cubic structure on annealing. However, the (FePt)0.95B0.05 film started to show a phase transformation from the disordered fee structure to the ordered L10 phase with an fct structure at 350 °C and was remarkably transformed to a L10 structure at about 500 °C on post-annealing. The maximum coercivities (Hc) of the (FePt)0.95B0.05 and the (FePt) 0.67B0.33 films were found to be ∼9.1 and 2.9 kOe after annealing at 600 °C for 1 hr, respectively.

Original languageEnglish
Pages (from-to)1034-1036
Number of pages3
JournalJournal of the Korean Physical Society
Issue number3
Publication statusPublished - 2006 Sep 1


  • Boron
  • Fct structure
  • FePt film
  • L1 phase
  • Ordering

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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