Structural and electrical properties of liquid phase epitaxially grown Y1Ba2Cu3Ox films

S. Miura, K. Hashimoto, F. Wang, Y. Enomoto, T. Morishita

Research output: Contribution to journalArticlepeer-review

72 Citations (Scopus)

Abstract

Y1Ba2Cu3Ox films, ranging in thickness from 0.9 to 10 μm, were grown on MgO(100) substrates by liquid phase epitaxy. These films were characterized structurally and electrically. From θ-2 θ and φ scan X-ray diffraction, and Rutherford backscattering spectrometry measurements, it was found that the films were c-axis oriented and had good in-plane alignment, showing that good epitaxial growth was achieved. The Tc,end values in a 20 mm long and 15 mm wide Y1Ba2Cu3Ox. film exceeded 90 K. The Tc and resistivity values did not become degraded after patterning into a strip. Although Jc values decreased with increasing film thickness, even a 7 μm-thick film showed a Jc value of 9.3 × 105 A/cm2 at 77 K. These data are comparable to those reported for Y1Ba2Cu3Ox films prepared on CeO2/YSZ(100) by pulse laser deposition, and thought to be due to the c-axis orientation and good in-plane alignment of the liquid phase epitaxially grown thick films.

Original languageEnglish
Pages (from-to)201-206
Number of pages6
JournalPhysica C: Superconductivity and its applications
Volume278
Issue number3-4
DOIs
Publication statusPublished - 1997 May 1
Externally publishedYes

Keywords

  • Critical current density
  • Liquid phase epitaxy
  • Structural properties
  • YBaCuO films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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