Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition

Hiroshi Naganuma, Andras Kovacs, Tetsuro Harima, Hiromi Shima, Soichiro Okamura, Yoshihiko Hirotsu

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

An interfacial epitaxial BiMnO3 layer was fabricated by chemical solution deposition on SrTiO3 (100) substrate, and the microstructure of the film was analyzed by x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). The TEM observation revealed the epitaxial growth of BiMnO3 on the SrTiO3 substrate as follows: ([110] (001)) BiMnO3 [0-10] (001) SrTiO3. XRD and TEM analyses revealed that the mismatch between the epitaxial BiMnO3 and the SrTiO3 substrate causes a distortion in lattice parameters of BiMnO3 and, consequently, a large compressive strain in the BiMnO3 layer.

Original languageEnglish
Article number07D915
JournalJournal of Applied Physics
Volume105
Issue number7
DOIs
Publication statusPublished - 2009

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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