TY - JOUR
T1 - Structural analysis of an InP(111)A surface using reflection high-energy electron diffraction rocking curves
AU - Horio, Yoshimi
AU - Yuhara, Junji
AU - Takakuwa, Yuji
PY - 2019/1/1
Y1 - 2019/1/1
N2 - The surface structure of InP(111)A has been investigated using reflection high-energy electron diffraction (RHEED) rocking curves and first-principles calculations. We used Ar ion sputtering and low-temperature annealing at about 200 °C as a cleaning method, which yields a (1 × 1) surface structure. RHEED rocking curves reveal that the interatomic distance of the top surface bilayer is compressive. First-principles calculations were performed based on a (2 × 2) unit mesh to obtain a stable structure. The calculated results suggest that a surface compressive bilayer is necessary when In atoms are removed from the surface. We conclude that the InP(111)A-(1 × 1) surface structure comprises about 20%-40% In defects, which exist randomly on the surface, and the compressed surface bilayer has an interval of 0.1 Å.
AB - The surface structure of InP(111)A has been investigated using reflection high-energy electron diffraction (RHEED) rocking curves and first-principles calculations. We used Ar ion sputtering and low-temperature annealing at about 200 °C as a cleaning method, which yields a (1 × 1) surface structure. RHEED rocking curves reveal that the interatomic distance of the top surface bilayer is compressive. First-principles calculations were performed based on a (2 × 2) unit mesh to obtain a stable structure. The calculated results suggest that a surface compressive bilayer is necessary when In atoms are removed from the surface. We conclude that the InP(111)A-(1 × 1) surface structure comprises about 20%-40% In defects, which exist randomly on the surface, and the compressed surface bilayer has an interval of 0.1 Å.
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U2 - 10.7567/1347-4065/ab106e
DO - 10.7567/1347-4065/ab106e
M3 - Article
AN - SCOPUS:85072828866
VL - 58
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - SI
M1 - SIIA14
ER -