Strong perpendicular exchange bias in sputter-deposited CoPt/CoO multilayers

J. Wang, T. Omi, T. Sannomiya, S. Muraishi, J. Shi, Y. Nakamura

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)

Fingerprint Dive into the research topics of 'Strong perpendicular exchange bias in sputter-deposited CoPt/CoO multilayers'. Together they form a unique fingerprint.

Physics & Astronomy