Strong localization of doped holes in La1-x Srx FeO3 from angle-resolved photoemission spectra

H. Wadati, A. Chikamatsu, M. Takizawa, R. Hashimoto, H. Kumigashira, T. Yoshida, T. Mizokawa, A. Fujimori, M. Oshima, M. Lippmaa, M. Kawasaki, H. Koinuma

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Abstract

We have performed an angle-resolved photoemission spectroscopy study of La0.6 Sr0.4 FeO3 using in situ prepared thin films and determined its band structure. The experimental band dispersions could be well explained by an empirical band structure assuming the G -type antiferromagnetic state. However, the Fe 3d bands were found to be shifted downward relative to the Fermi level (EF) by ∼1 eV compared with the calculation and to form a gap of ∼1 eV at EF. We attribute this observation to a strong localization effect of doped holes due to polaron formation.

Original languageEnglish
Article number115114
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume74
Issue number11
DOIs
Publication statusPublished - 2006 Sep 25
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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    Wadati, H., Chikamatsu, A., Takizawa, M., Hashimoto, R., Kumigashira, H., Yoshida, T., Mizokawa, T., Fujimori, A., Oshima, M., Lippmaa, M., Kawasaki, M., & Koinuma, H. (2006). Strong localization of doped holes in La1-x Srx FeO3 from angle-resolved photoemission spectra. Physical Review B - Condensed Matter and Materials Physics, 74(11), [115114]. https://doi.org/10.1103/PhysRevB.74.115114