TY - JOUR
T1 - Stress relaxation measurement of fibroblast cells with atomic force microscopy
AU - Okajima, Takaharu
AU - Tanaka, Masara
AU - Tsukiyama, Shusaku
AU - Kadowaki, Tsubasa
AU - Yamamoto, Sadaaki
AU - Shimomura, Masatsugu
AU - Tokumoto, Hiroshi
N1 - Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2007/8/23
Y1 - 2007/8/23
N2 - We measured the stress relaxation of mouse fibroblast NIH3T3 cells with an atomic force microscope (AFM) using a sharp silicon tip and a silica bead with a radius of ∼1 μm as an indenter. The decay of loading force was clearly observed in NIH3T3 cells at a small initial loading force of ∼0.4 nN and was well fitted to the stretched exponential function rather than to a single exponential function. The stretching exponent parameter was ∼0.5 for both indenters, indicating that the stress relaxation observed in NIH3T3 cells consisted of multiple relaxation processes. The time-domain AFM technique described in this report allows us to measure directly the relaxation process of living cells in a range from milliseconds to seconds.
AB - We measured the stress relaxation of mouse fibroblast NIH3T3 cells with an atomic force microscope (AFM) using a sharp silicon tip and a silica bead with a radius of ∼1 μm as an indenter. The decay of loading force was clearly observed in NIH3T3 cells at a small initial loading force of ∼0.4 nN and was well fitted to the stretched exponential function rather than to a single exponential function. The stretching exponent parameter was ∼0.5 for both indenters, indicating that the stress relaxation observed in NIH3T3 cells consisted of multiple relaxation processes. The time-domain AFM technique described in this report allows us to measure directly the relaxation process of living cells in a range from milliseconds to seconds.
KW - Atomic force microscope
KW - Colloidal probe
KW - Living cells
KW - Stress relaxation
KW - Viscoelastic properties
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U2 - 10.1143/JJAP.46.5552
DO - 10.1143/JJAP.46.5552
M3 - Article
AN - SCOPUS:34548239212
VL - 46
SP - 5552
EP - 5555
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 8 B
ER -