Streak-camera reflection high-energy electron diffraction for dynamics of surface crystallography

Kenta Mukojima, Shinji Kanzaki, Kota Kawanishi, Katsuyoshi Sato, Tadashi Abukawa

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

A new technique for ultrafast dynamics of surface crystallography was developed by combining reflection high-energy electron diffraction with the electron deflectors of a streak camera system. A one-dimensional distribution of electrons scattered by a crystal surface is selected by a linear slit on a screen, and then the electrons are quickly deflected by the sweep electrodes behind the slit. Thus, a temporal evolution of the one-dimensional diffraction pattern can be displayed as a streak image on a screen. This is a unique method of time-resolved electron diffraction, as a pulsed electron beam is not required to obtain a temporal evolution. The temporal evolution of the diffraction pattern can be projected on a screen from single-shot measurements. The technique was tested on an Si(111)-7 × 7 surface, and the dynamics of the surface structure were successively obtained from changes in spot intensities. Although the present time time-resolution was limited by the present pumping laser ∼ 5 ns, the nominal resolution of the streak system is expected to be ∼100 ps.

Original languageEnglish
Pages (from-to)25-30
Number of pages6
JournalSurface Science
Volume636
DOIs
Publication statusPublished - 2015 Jan 1

Keywords

  • RHEED
  • Streak camera Si(111)
  • Structure dynamics
  • Surface structure
  • Time resolved diffraction

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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