Strain effects in VAMAS round robin test wires

K. Katagiri; K. Saito; M. Ohgami; T. Okada; A. Nagata; K. Noto; K. Watanabe; K. Itoh; H. Wada; K. Tachikawa; J. W. Ekin; C. R. Walters

Strain effects in VAMAS round robin test wires

K. Katagiri, K. Saito, M. Ohgami, T. Okada, A. Nagata, K. Noto, K. Watanabe, K. Itoh, H. Wada, K. Tachikawa, J. W. Ekin, C. R. Walters

Research output: Chapter in Book/Report/Conference proceeding › Chapter

3 Citations (Scopus)

Abstract

The strain characteristics of critical current, I_c, in three kinds of VAMAS round robin test wires were evaluated. The multifilamentary Nb₃Sn samples measured are: bronze route Ta added and internally stabilized wire A, Ti added and externally stabilized wire B and internal tin diffusion processed wire C, respectively. The strain for I_c peak ranged 0.20-0.30% and the reversible strain limit 0.8-1.1%. The results obtained at 15 T in three institutes, NIST, Rutherford Lab. and Osaka/Tohoku Univ., are compared. Fairly good agreement was obtained. The strain sensitivity was higher in the order of C, A and B. This can be mainly attributed to the effect of addition of the third element. The correlation between the strain sensitivity and the scatter of critical currents measured in the round robin test participant laboratories is briefly discussed.

Original language	English
Title of host publication	Advances in Cryogenic Engineering
Publisher	Publ by Plenum Publ Corp
Pages	61-68
Number of pages	8
Volume	36
Edition	pt A
ISBN (Print)	0306435985
Publication status	Published - 1990
Externally published	Yes
Event	Proceedings of the 8th International Cryogenic Materials Conference ICMC - Los Angeles, CA, USA Duration: 1989 Jul 24 → 1989 Jul 28

Other

Other	Proceedings of the 8th International Cryogenic Materials Conference ICMC
City	Los Angeles, CA, USA
Period	89/7/24 → 89/7/28

ASJC Scopus subject areas

Engineering(all)

Cite this

Katagiri, K, Saito, K, Ohgami, M, Okada, T, Nagata, A, Noto, K, Watanabe, K, Itoh, K, Wada, H, Tachikawa, K, Ekin, JW & Walters, CR 1990, Strain effects in VAMAS round robin test wires. in Advances in Cryogenic Engineering. pt A edn, vol. 36, Publ by Plenum Publ Corp, pp. 61-68, Proceedings of the 8th International Cryogenic Materials Conference ICMC, Los Angeles, CA, USA, 89/7/24.

@inbook{df2489d594da442e837223fb1af25ece,

title = "Strain effects in VAMAS round robin test wires",

abstract = "The strain characteristics of critical current, Ic, in three kinds of VAMAS round robin test wires were evaluated. The multifilamentary Nb3Sn samples measured are: bronze route Ta added and internally stabilized wire A, Ti added and externally stabilized wire B and internal tin diffusion processed wire C, respectively. The strain for Ic peak ranged 0.20-0.30% and the reversible strain limit 0.8-1.1%. The results obtained at 15 T in three institutes, NIST, Rutherford Lab. and Osaka/Tohoku Univ., are compared. Fairly good agreement was obtained. The strain sensitivity was higher in the order of C, A and B. This can be mainly attributed to the effect of addition of the third element. The correlation between the strain sensitivity and the scatter of critical currents measured in the round robin test participant laboratories is briefly discussed.",

author = "K. Katagiri and K. Saito and M. Ohgami and T. Okada and A. Nagata and K. Noto and K. Watanabe and K. Itoh and H. Wada and K. Tachikawa and Ekin, {J. W.} and Walters, {C. R.}",

year = "1990",

language = "English",

isbn = "0306435985",

volume = "36",

pages = "61--68",

booktitle = "Advances in Cryogenic Engineering",

publisher = "Publ by Plenum Publ Corp",

edition = "pt A",

note = "Proceedings of the 8th International Cryogenic Materials Conference ICMC ; Conference date: 24-07-1989 Through 28-07-1989",

}

TY - CHAP

T1 - Strain effects in VAMAS round robin test wires

AU - Katagiri, K.

AU - Saito, K.

AU - Ohgami, M.

AU - Okada, T.

AU - Nagata, A.

AU - Noto, K.

AU - Watanabe, K.

AU - Itoh, K.

AU - Wada, H.

AU - Tachikawa, K.

AU - Ekin, J. W.

AU - Walters, C. R.

PY - 1990

Y1 - 1990

N2 - The strain characteristics of critical current, Ic, in three kinds of VAMAS round robin test wires were evaluated. The multifilamentary Nb3Sn samples measured are: bronze route Ta added and internally stabilized wire A, Ti added and externally stabilized wire B and internal tin diffusion processed wire C, respectively. The strain for Ic peak ranged 0.20-0.30% and the reversible strain limit 0.8-1.1%. The results obtained at 15 T in three institutes, NIST, Rutherford Lab. and Osaka/Tohoku Univ., are compared. Fairly good agreement was obtained. The strain sensitivity was higher in the order of C, A and B. This can be mainly attributed to the effect of addition of the third element. The correlation between the strain sensitivity and the scatter of critical currents measured in the round robin test participant laboratories is briefly discussed.

AB - The strain characteristics of critical current, Ic, in three kinds of VAMAS round robin test wires were evaluated. The multifilamentary Nb3Sn samples measured are: bronze route Ta added and internally stabilized wire A, Ti added and externally stabilized wire B and internal tin diffusion processed wire C, respectively. The strain for Ic peak ranged 0.20-0.30% and the reversible strain limit 0.8-1.1%. The results obtained at 15 T in three institutes, NIST, Rutherford Lab. and Osaka/Tohoku Univ., are compared. Fairly good agreement was obtained. The strain sensitivity was higher in the order of C, A and B. This can be mainly attributed to the effect of addition of the third element. The correlation between the strain sensitivity and the scatter of critical currents measured in the round robin test participant laboratories is briefly discussed.

UR - http://www.scopus.com/inward/record.url?scp=0025523012&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0025523012&partnerID=8YFLogxK

M3 - Chapter

AN - SCOPUS:0025523012

SN - 0306435985

VL - 36

SP - 61

EP - 68

BT - Advances in Cryogenic Engineering

PB - Publ by Plenum Publ Corp

T2 - Proceedings of the 8th International Cryogenic Materials Conference ICMC

Y2 - 24 July 1989 through 28 July 1989

ER -

Strain effects in VAMAS round robin test wires

Abstract

Other

ASJC Scopus subject areas

Other files and links

Fingerprint

Cite this