Strain effects in VAMAS round robin test wires

K. Katagiri, K. Saito, M. Ohgami, T. Okada, A. Nagata, K. Noto, K. Watanabe, K. Itoh, H. Wada, K. Tachikawa, J. W. Ekin, C. R. Walters

Research output: Chapter in Book/Report/Conference proceedingChapter

3 Citations (Scopus)

Abstract

The strain characteristics of critical current, Ic, in three kinds of VAMAS round robin test wires were evaluated. The multifilamentary Nb3Sn samples measured are: bronze route Ta added and internally stabilized wire A, Ti added and externally stabilized wire B and internal tin diffusion processed wire C, respectively. The strain for Ic peak ranged 0.20-0.30% and the reversible strain limit 0.8-1.1%. The results obtained at 15 T in three institutes, NIST, Rutherford Lab. and Osaka/Tohoku Univ., are compared. Fairly good agreement was obtained. The strain sensitivity was higher in the order of C, A and B. This can be mainly attributed to the effect of addition of the third element. The correlation between the strain sensitivity and the scatter of critical currents measured in the round robin test participant laboratories is briefly discussed.

Original languageEnglish
Title of host publicationAdvances in Cryogenic Engineering
PublisherPubl by Plenum Publ Corp
Pages61-68
Number of pages8
Volume36
Editionpt A
ISBN (Print)0306435985
Publication statusPublished - 1990
EventProceedings of the 8th International Cryogenic Materials Conference ICMC - Los Angeles, CA, USA
Duration: 1989 Jul 241989 Jul 28

Other

OtherProceedings of the 8th International Cryogenic Materials Conference ICMC
CityLos Angeles, CA, USA
Period89/7/2489/7/28

ASJC Scopus subject areas

  • Engineering(all)

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