Abstract
The strain characteristics of critical current, Ic, in three kinds of VAMAS round robin test wires were evaluated. The multifilamentary Nb3Sn samples measured are: bronze route Ta added and internally stabilized wire A, Ti added and externally stabilized wire B and internal tin diffusion processed wire C, respectively. The strain for Ic peak ranged 0.20-0.30% and the reversible strain limit 0.8-1.1%. The results obtained at 15 T in three institutes, NIST, Rutherford Lab. and Osaka/Tohoku Univ., are compared. Fairly good agreement was obtained. The strain sensitivity was higher in the order of C, A and B. This can be mainly attributed to the effect of addition of the third element. The correlation between the strain sensitivity and the scatter of critical currents measured in the round robin test participant laboratories is briefly discussed.
Original language | English |
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Title of host publication | Advances in Cryogenic Engineering |
Publisher | Publ by Plenum Publ Corp |
Pages | 61-68 |
Number of pages | 8 |
Volume | 36 |
Edition | pt A |
ISBN (Print) | 0306435985 |
Publication status | Published - 1990 |
Event | Proceedings of the 8th International Cryogenic Materials Conference ICMC - Los Angeles, CA, USA Duration: 1989 Jul 24 → 1989 Jul 28 |
Other
Other | Proceedings of the 8th International Cryogenic Materials Conference ICMC |
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City | Los Angeles, CA, USA |
Period | 89/7/24 → 89/7/28 |
ASJC Scopus subject areas
- Engineering(all)