STM light emission spectra of individual nanostructures of porous Si

K. Ito, S. Ohyama, Y. Uehara, S. Ushioda

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

We have measured the visible emission spectra of individual protrusions of the porous Si (PS) surface using an STM light emission spectroscopy technique. We found that the peak energy of the emission spectrum shifts with the size of the nanoscale structures on the PS surface. The peak energy of the emission shifts from ∼1.7 to ∼2.1 eV as the diameter of the protrusion below the STM tip decreases from ∼9 to ∼3 nm. The measured peak shift with the size of the protrusion is consistent with the shift of the energy gap predicted on the basis of a quantum confinement model.

Original languageEnglish
Pages (from-to)423-427
Number of pages5
JournalSurface Science
Volume363
Issue number1-3
DOIs
Publication statusPublished - 1996 Aug 1

Keywords

  • Clusters
  • Inverse photoemission spectroscopy
  • Luminescence
  • Porous solids
  • Scanning tunneling microscopy
  • Silicon
  • Surface structure, morphology, roughness, and typography

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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