Statistical Test Methodology for Evaluating Electromagnetic Information Leakage from Mobile Touchscreen Devices

Ville Yli-Mäyry, Daisuke Miyata, Naofumi Homma, Yuichi Hayashi, Takafumi Aoki

Research output: Contribution to journalArticlepeer-review

Abstract

This paper presents a statistical-test-based methodology for evaluating the electromagnetic (EM) emanations from mobile touchscreen devices. These EM emanations potentially contain information that can be exploited to reconstruct screen images of the device remotely. The proposed method evaluates the threat of such EM-based information leakage by performing a statistical test of measured EM waves and environmental noise without performing ad-hoc screen restoration or image processing. In particular, we employ the Kolmogorov-Smirnov test, a nonparametric statistical test method, to compare two distributions of radiated EM waves: one that potentially contains screen information and another with environmental noise. In addition, this paper demonstrates the validity of our methodology via experiments involving authentic tablet devices in real-world settings and discusses a possible method to determine the confidence interval that can be adopted as a criterion for security evaluation depending on the environment.

Original languageEnglish
Article number8698818
Pages (from-to)1107-1114
Number of pages8
JournalIEEE Transactions on Electromagnetic Compatibility
Volume61
Issue number4
DOIs
Publication statusPublished - 2019 Aug

Keywords

  • Electromagnetic (EM) analysis
  • electromagnetic information leakage
  • hardware security
  • security evaluation
  • statistical test

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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