Abstract
Ta-doped SnO2 (Sn0.99Ta0.01O2; TTO) films were successfully sputter deposited with a high mobility of 49 cm2 V-1 s-1 on glass coated with anatase-TiO2 seed layers. The high mobility enabled the achievement of a film resistivity of 5.9 × 10-4 Ω cm. This value of resistivity is one of the lowest ever reported for SnO2-based polycrystalline films without enhanced free-carrier absorption. An optimized film with a sheet resistance of 14Ω/ exhibited a transmittance of more than 70%, even in the near-infrared region. These results demonstrate that sputtered TTO films obtained by the TiO2 seed layer method are suitable for use in transparent electrodes in solar cells.
Original language | English |
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Pages (from-to) | 1080021-1080022 |
Number of pages | 2 |
Journal | Japanese journal of applied physics |
Volume | 49 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2010 Oct |
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)