A study was performed on spin dependent transport phenomena in the NiFe/AlO/Cu/AlO/NiFe double tunnel junctions. The spin injection and accumulation induced phenomena such as spin current driven magnetic switching and spin transistors were presented. The characteristic tunnel magnetoresistance (TMR) effect in various ferromagnet/normal-metal/ferromagnet (F/N/F) junctions was also examined.
ASJC Scopus subject areas
- Electrical and Electronic Engineering