Spin dependent transport phenomena in the NiFe/AlO/Cu/AlO/NiFe double tunnel junctions

J. Hayakawa, K. Itou, M. Ichimura, A. Sakuma

Research output: Contribution to journalConference articlepeer-review

Abstract

A study was performed on spin dependent transport phenomena in the NiFe/AlO/Cu/AlO/NiFe double tunnel junctions. The spin injection and accumulation induced phenomena such as spin current driven magnetic switching and spin transistors were presented. The characteristic tunnel magnetoresistance (TMR) effect in various ferromagnet/normal-metal/ferromagnet (F/N/F) junctions was also examined.

Original languageEnglish
Pages (from-to)GD07
JournalDigests of the Intermag Conference
Publication statusPublished - 2003 Oct 1
Externally publishedYes
EventIntermag 2003: International Magnetics Conference - Boston, MA, United States
Duration: 2003 Mar 282003 Apr 3

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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