Abstract
A study was performed on spin dependent transport phenomena in the NiFe/AlO/Cu/AlO/NiFe double tunnel junctions. The spin injection and accumulation induced phenomena such as spin current driven magnetic switching and spin transistors were presented. The characteristic tunnel magnetoresistance (TMR) effect in various ferromagnet/normal-metal/ferromagnet (F/N/F) junctions was also examined.
| Original language | English |
|---|---|
| Pages (from-to) | GD07 |
| Journal | Digests of the Intermag Conference |
| Publication status | Published - 2003 Oct 1 |
| Externally published | Yes |
| Event | Intermag 2003: International Magnetics Conference - Boston, MA, United States Duration: 2003 Mar 28 → 2003 Apr 3 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering