We have determined the ground-state wave functions and crystal-field-level schemes of CeRh 2Si 2 and CeRu 2Si 2 using linear polarized soft x-ray-absorption spectroscopy (XAS) and inelastic neutron scattering. We find large crystal-field splittings and ground-state wave functions which are made of mainly J z= |±5/2 with some amount of |3/2 in both the compounds. The 4f0 contribution to the ground state of several members of the CeM 2Si 2 family with M=(Cu, Ru, Rh, Pd, and Au) has been determined with XAS, and the comparison reveals a trend concerning the delocalization of the f electrons. Absolute numbers are extracted from scaling to results from hard x-ray photoelectron spectroscopy on CeRu 2Si 2 by Yano.
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|Publication status||Published - 2012 Jan 18|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics