Spectroscopic determination of crystal-field levels in CeRh 2Si 2 and CeRu 2Si 2 and of the 4f0 contributions in CeM 2Si 2 (M=Cu, Ru, Rh, Pd, and Au)

T. Willers, D. T. Adroja, B. D. Rainford, Z. Hu, N. Hollmann, P. O. Körner, Y. Y. Chin, D. Schmitz, H. H. Hsieh, H. J. Lin, C. T. Chen, E. D. Bauer, J. L. Sarrao, K. J. McClellan, D. Byler, C. Geibel, F. Steglich, H. Aoki, P. Lejay, A. TanakaL. H. Tjeng, A. Severing

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33 Citations (Scopus)


We have determined the ground-state wave functions and crystal-field-level schemes of CeRh 2Si 2 and CeRu 2Si 2 using linear polarized soft x-ray-absorption spectroscopy (XAS) and inelastic neutron scattering. We find large crystal-field splittings and ground-state wave functions which are made of mainly J z= |±5/2 with some amount of |3/2 in both the compounds. The 4f0 contribution to the ground state of several members of the CeM 2Si 2 family with M=(Cu, Ru, Rh, Pd, and Au) has been determined with XAS, and the comparison reveals a trend concerning the delocalization of the f electrons. Absolute numbers are extracted from scaling to results from hard x-ray photoelectron spectroscopy on CeRu 2Si 2 by Yano.

Original languageEnglish
Article number035117
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number3
Publication statusPublished - 2012 Jan 18

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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