Spatial resolution of imaging contaminations on the GaAs surface by scanning tunneling microscope-cathodoluminescence spectroscopy

Kentaro Watanabe, Yoshiaki Nakamura, Masakazu Ichikawa

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We obtained the luminescence image of the GaAs (1 1 0) surface by scanning tunneling microscope-cathodoluminescence (STM-CL) spectroscopy, where low-energy (∼100 eV) electrons field emitted from the STM tip were used as a bright excitation source. The STM-CL image with high photon signal (1.25 × 10 4 cps) showed the dark image corresponding to the surface contamination in the STM image working as the nonradiative recombination centers of carriers. This dark image demonstrated the spatial resolution of about 100 nm in STM-CL spectroscopy of the GaAs (1 1 0) surface, which was determined by the field-emitted electron beam diameter.

Original languageEnglish
Pages (from-to)7737-7741
Number of pages5
JournalApplied Surface Science
Volume254
Issue number23
DOIs
Publication statusPublished - 2008 Sep 30
Externally publishedYes

Keywords

  • Cathodoluminescence
  • Field emission
  • GaAs
  • Scanning tunneling microscopy

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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