Spatial resolution for fluorescence depletion microscopy using axial electric field generated by focused radially polarized beams

Shunichi Sato, Yuichi Kozawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Spatial resolution for depletion microscopy is estimated when radially polarized beams are used for excitation and depletion. Axial electric fields generated by focused radially polarized beams play an important role for the improvement of resolution.

Original languageEnglish
Title of host publicationNovel Techniques in Microscopy, NTM 2009
PublisherOptical Society of America (OSA)
ISBN (Print)9781557528711
DOIs
Publication statusPublished - 2009
EventNovel Techniques in Microscopy, NTM 2009 - Vancouver, Canada
Duration: 2009 Apr 262009 Apr 30

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherNovel Techniques in Microscopy, NTM 2009
CountryCanada
CityVancouver
Period09/4/2609/4/30

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Sato, S., & Kozawa, Y. (2009). Spatial resolution for fluorescence depletion microscopy using axial electric field generated by focused radially polarized beams. In Novel Techniques in Microscopy, NTM 2009 (Optics InfoBase Conference Papers). Optical Society of America (OSA). https://doi.org/10.1364/ntm.2009.nma3