Solidification thickness dependent electrostriction of polyurethane films

Masae Kanda, Kaori Yuse, Benoit Guiffard, Laurent Lebrun, Yoshitake Nishi, Daniel Guyomar

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

To obtain large electrostriction (Smax) at low electric filed (Emax), a dependence of the solidification thickness (L) on Smax was investigated for polyurethane films. Thinning the films remarkably enhanced Smax at high Emax at 20MV/m, whereas thick films apparently exhibited higher Smax at low Emax of less than 3MV/m. The L dependent Smax from 5.01% for 140μm thickness to 30.99% for 28μm thickness exhibited linear relationship of pure polyurethane. Considering crystalline volume fraction and crystalline periodicity, the L dependent Smax was explained.

Original languageEnglish
Pages (from-to)1806-1809
Number of pages4
JournalMaterials Transactions
Volume53
Issue number10
DOIs
Publication statusPublished - 2012 Oct 5
Externally publishedYes

Keywords

  • Crystalline periodicity
  • Electro active
  • Electrostriction

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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