Solid surface density determination using the glancing-takeoff X-ray fluorescence method

Kouichi Tsuji, Kazuaki Wagatsuma

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

This paper proposes a method to determine both the density of a sample's surface and the zero angle. We accomplish this by analyzing the relative peak angles in the takeoff-angle dependent curves of fluorescent X-rays from the ultrathin film. The merit of this method is that the density of a solid surface can be determined without knowing the absolute takeoff angle. We applied this method to a Ni film, and obtained a density of 7.37g/cm3.

Original languageEnglish
Pages (from-to)L1535-L1537
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume35
Issue number11 SUPPL. B
Publication statusPublished - 1996 Nov 15

Keywords

  • Glancing-takeoff
  • Surface density
  • Thin film
  • Total reflection
  • X-ray fluorescence

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

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