Abstract
We find that small particles (1 nm) of solid argon are densely precipitated in a Pd40Ni20P20 metallic glass matrix after argon ion-beam irradiation with an accelerating voltage of 4 keV. This is in sharp contrast to the case of noble-gas implantations into crystalline metals, for which high-energy beam (50-300 keV) has been essential to promote creations of precursor defects, such as voids or vacancy aggregates for initial confinements of noble-gas atoms. Therefore, the present low-energy implantation implies that the argon confinements have occurred at pre-existing low-density regions in the glass matrix, providing an important clue to phenomenological free-volume entities.
Original language | English |
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Pages (from-to) | 94-99 |
Number of pages | 6 |
Journal | Materials Research Letters |
Volume | 2 |
Issue number | 2 |
DOIs | |
Publication status | Published - 2014 |
Externally published | Yes |
Keywords
- Electron microscopy
- Metallic glass
- Microstructure
ASJC Scopus subject areas
- Materials Science(all)