Solar system planets observed with Suzaku

Yuichiro Ezoe, Kumi Ishikawa, Takaya Ohashi, Noriko Y. Yamasaki, Kazuhisa Mitsuda, Ryuichi Fujimoto, Yoshizumi Miyoshi, Naoki Terada, Yasunobu Uchiyama, Yoshifumi Futaana

Research output: Contribution to journalReview articlepeer-review

6 Citations (Scopus)


Recent results of solar system planets observed with the Japanese X-ray astronomy satellite Suzaku are reviewed. Thanks to the low instrumental background and good energy resolution, X-ray CCDs onboard Suzaku are one of the best probes to study diffuse X-ray emission. An overview of the Suzaku data of Jupiter and Earth is presented, along with preliminary results of Mars. Firstly, diffuse hard X-ray emission is discovered in 1-5 keV at Jovian radiation belts. Its spectrum is represented by a power-law continuum with a photon index of ∼1.4. This emission could originate from inverse-Compton scattering of solar photons by tens MeV electrons. Secondly, variable diffuse soft X-rays are serendipitously found during observations in the directions of the north ecliptic pole and galactic ridge. Good time correlations with the solar wind and emission lines found in the X-ray spectra are firm evidences of a solar wind charge exchange emission with Earth's exosphere. Thirdly, diffuse X-ray emission from Martian exosphere via the solar wind charge exchange is investigated for the first time at solar minimum. A stringent upper limit on the density of the Martian exosphere is placed from the Suzaku data.

Original languageEnglish
Pages (from-to)411-418
Number of pages8
JournalAdvances in Space Research
Issue number3
Publication statusPublished - 2011 Feb 1


  • Earth
  • Jupiter
  • Mars
  • Solar system objects
  • X-ray

ASJC Scopus subject areas

  • Aerospace Engineering
  • Astronomy and Astrophysics
  • Geophysics
  • Atmospheric Science
  • Space and Planetary Science
  • Earth and Planetary Sciences(all)


Dive into the research topics of 'Solar system planets observed with Suzaku'. Together they form a unique fingerprint.

Cite this