Soft x-ray synchrotron radiation spectroscopy study of CuFe 1-xNixO2 (0≤x≤0.03) delafossite oxides

D. H. Kim, J. H. Hwang, K. H. Lee, J. S. Kang, T. Nozaki, K. Hayashi, T. Kajitani, B. G. Park, J. Y. Kim, B. I. Min

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4 Citations (Scopus)


Electronic structures of Ni-doped CuFe1-xNixO 2 delafossite oxides (x=0, 0.015, and 0.03) have been investigated by employing soft x-ray absorption spectroscopy and soft x-ray magnetic circular dichroism (XMCD). It is found that the valence states of Cu, Fe, and Ni ions are nearly monovalent (Cu+), trivalent (Fe3+), and divalent (Ni2+), respectively, and that they do not change with x. In contrast, the Cu 2p XMCD signals, which arise from the Cu2+ states, increase with increasing x. This study suggests that the increasing XMCD signals are presumably related to the formation of ferrimagnetic spinel impurities in CuFe1-xNixO2.

Original languageEnglish
Article number07D727
JournalJournal of Applied Physics
Issue number7
Publication statusPublished - 2011 Apr 1

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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