Soft x-ray synchrotron radiation spectroscopy study of CuFe 1-xNixO2 (0≤x≤0.03) delafossite oxides

D. H. Kim, J. H. Hwang, K. H. Lee, J. S. Kang, T. Nozaki, K. Hayashi, T. Kajitani, B. G. Park, J. Y. Kim, B. I. Min

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Abstract

Electronic structures of Ni-doped CuFe1-xNixO 2 delafossite oxides (x=0, 0.015, and 0.03) have been investigated by employing soft x-ray absorption spectroscopy and soft x-ray magnetic circular dichroism (XMCD). It is found that the valence states of Cu, Fe, and Ni ions are nearly monovalent (Cu+), trivalent (Fe3+), and divalent (Ni2+), respectively, and that they do not change with x. In contrast, the Cu 2p XMCD signals, which arise from the Cu2+ states, increase with increasing x. This study suggests that the increasing XMCD signals are presumably related to the formation of ferrimagnetic spinel impurities in CuFe1-xNixO2.

Original languageEnglish
Article number07D727
JournalJournal of Applied Physics
Volume109
Issue number7
DOIs
Publication statusPublished - 2011 Apr 1

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Kim, D. H., Hwang, J. H., Lee, K. H., Kang, J. S., Nozaki, T., Hayashi, K., Kajitani, T., Park, B. G., Kim, J. Y., & Min, B. I. (2011). Soft x-ray synchrotron radiation spectroscopy study of CuFe 1-xNixO2 (0≤x≤0.03) delafossite oxides. Journal of Applied Physics, 109(7), [07D727]. https://doi.org/10.1063/1.3561041