Soft x-ray reflection from sic, tic, and wc mirrors

Mihiro Yanagihara, Michio Niwano, Tsuneharu Koide, Shigeru Sato, Tsuneaki Miyahara, Yasuo Iquchi, Shigeo Yamaguchi, Taizo Sasaki

Research output: Contribution to journalArticlepeer-review

32 Citations (Scopus)


The optical constants of SiC, TiC, and WC in the soft x-ray region (80-1200 eV) derived from the incidence- angle dependence of the specular reflectance are reported. The angular dependence of the specular intensity can be explained by simple scattering theory with a Gaussian distribution of the surface roughness in the soft x-ray wavelength range.

Original languageEnglish
Pages (from-to)4586-4590
Number of pages5
JournalApplied optics
Issue number24
Publication statusPublished - 1986 Dec 15
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering


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