Soft x-ray optical constants: Pt, Ag, and Cu

Mihiro Niwano, Michio Niwano, Tsuneharu Koide, Shigeru Sato

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)


The optical constants of Pt, Ag, and Cu in the soft X-ray region (100-1200 eV) derived from the reflectance method are reported. Samples were thickly deposited on substrates so that interference effects would be negligible. Using Debye-Waller and constant factors we could explain the angular dependence of the specular reflection of the soft X-rays from conventionally-evaporated mirrors.

Original languageEnglish
Pages (from-to)666-669
Number of pages4
JournalJapanese journal of applied physics
Issue number4R
Publication statusPublished - 1988 Apr


  • Ag
  • Cu
  • Optical constant
  • Pt
  • Reflection
  • Soft x-ray
  • Surface roughness

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)


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