Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics

I. A. Artyukov, R. M. Feschenko, A. V. Vinogradov, Ye A. Bugayev, O. Y. Devizenko, V. V. Kondratenko, Yu S. Kasyanov, Tadashi Hatano, M. Yamamoto, S. V. Saveliev

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

The high transparency of carbon-containing materials in the spectral region of " carbon window" (λ~ 4.5-5 nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5. nm has stimulated a series of our imaging experiments to study thick biological and synthetic objects. Our experimental set-up consisted of a laser plasma X-ray source generated with the 2nd harmonics of Nd-glass laser, scandium-based thin-film filters, Co/C multilayer mirror and X-ray film UF-4. All soft X-ray images were produced with a single nanosecond exposure and demonstrated appropriate absorption contrast and detector-limited spatial resolution. A special attention was paid to the 3D imaging of thick low-density foam materials to be used in design of laser fusion targets.

Original languageEnglish
Pages (from-to)722-728
Number of pages7
JournalMicron
Volume41
Issue number7
DOIs
Publication statusPublished - 2010 Oct 1

Keywords

  • Carbon window
  • Laser plasma
  • Soft X-ray microscopy
  • X-ray multilayer mirror

ASJC Scopus subject areas

  • Structural Biology
  • Materials Science(all)
  • Physics and Astronomy(all)
  • Cell Biology

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    Artyukov, I. A., Feschenko, R. M., Vinogradov, A. V., Bugayev, Y. A., Devizenko, O. Y., Kondratenko, V. V., Kasyanov, Y. S., Hatano, T., Yamamoto, M., & Saveliev, S. V. (2010). Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics. Micron, 41(7), 722-728. https://doi.org/10.1016/j.micron.2010.06.011