Soft x-ray emission spectrometer equipped with a multilayer rotating analyzer for study of the polarized emission

Mihiro Yanagihara, Yoshinori Goto, Noboru Miyata, Minaji Furudate

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

A soft x-ray emission spectrometer equipped with a multilayer rotating analyzer has been made. The spectrometer covers an energy range of 50-500 eV with a resolution power of about 300. Using the rotating analyzer we have measured the polarization of the B K emission of h-BN, and have found that it is dominantly polarized perpendicularly to the c-axis, which agrees well with the experimental result.

Original languageEnglish
Pages (from-to)1595-1597
Number of pages3
JournalReview of Scientific Instruments
Volume66
Issue number2
DOIs
Publication statusPublished - 1995 Dec 1

ASJC Scopus subject areas

  • Instrumentation

Fingerprint Dive into the research topics of 'Soft x-ray emission spectrometer equipped with a multilayer rotating analyzer for study of the polarized emission'. Together they form a unique fingerprint.

Cite this