Soft x-ray (97-eV) phase retardation using transmission multilayers

J. B. Kortright, H. Kimura, V. Nikitin, K. Mayama, M. Yamamoto, M. Yanagihara

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Abstract

Phase retardation as a function of incidence angle of 97-eV soft x rays from a laser plasma source on transmission through a free-standing molybdenum/silicon multilayer was measured using a multilayer polarizer and a polarization analyzer. The maximum retardation of 49°between σ and π components is over 2/3 that calculated for an ideal structure. At maximum retardation the transmittance ratio of σ- to π-amplitudes was 0.66 and the intensity transmittance, averaged for both components, was 20%. These multilayer structures will be useful in soft x-ray polarization applications.

Original languageEnglish
Pages (from-to)2963-2965
Number of pages3
JournalApplied Physics Letters
Volume60
Issue number24
DOIs
Publication statusPublished - 1992 Dec 1

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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    Kortright, J. B., Kimura, H., Nikitin, V., Mayama, K., Yamamoto, M., & Yanagihara, M. (1992). Soft x-ray (97-eV) phase retardation using transmission multilayers. Applied Physics Letters, 60(24), 2963-2965. https://doi.org/10.1063/1.106802