Abstract
The effects of additional elements, such as Al and O, on the magnetic and electrical properties of the Fe-N-Al-O films were studied. As a result, the relationship between soft magnetic properties and microstructure was established.
Original language | English |
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Pages (from-to) | CD-07 |
Journal | Digests of the Intermag Conference |
Publication status | Published - 2000 |
Externally published | Yes |
Event | 2000 IEEE International Magnetics Conference-2000 IEEE INTERMAG - Toronto, Ont, Can Duration: 2000 Apr 9 → 2000 Apr 13 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering