Soft magnetic properties and microstructure of high moment Fe-N-Al-O films for recording head materials

S. Ikeda, Y. Uehara, I. Tagawa, N. Takeguchi, M. Kakehi

Research output: Contribution to journalConference articlepeer-review

Abstract

The effects of additional elements, such as Al and O, on the magnetic and electrical properties of the Fe-N-Al-O films were studied. As a result, the relationship between soft magnetic properties and microstructure was established.

Original languageEnglish
Pages (from-to)CD-07
JournalDigests of the Intermag Conference
Publication statusPublished - 2000
Externally publishedYes
Event2000 IEEE International Magnetics Conference-2000 IEEE INTERMAG - Toronto, Ont, Can
Duration: 2000 Apr 92000 Apr 13

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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