The effects of additional elements, such as Al and O, on the magnetic and electrical properties of the Fe-N-Al-O films were studied. As a result, the relationship between soft magnetic properties and microstructure was established.
|Journal||Digests of the Intermag Conference|
|Publication status||Published - 2000|
|Event||2000 IEEE International Magnetics Conference-2000 IEEE INTERMAG - Toronto, Ont, Can|
Duration: 2000 Apr 9 → 2000 Apr 13
ASJC Scopus subject areas
- Electrical and Electronic Engineering