Soft magnetic properties and microstructure of high moment Fe-N-Al-O films for recording head materials

S. Ikeda; Y. Uehara; I. Tagawa; N. Takeguchi; M. Kakehi

Soft magnetic properties and microstructure of high moment Fe-N-Al-O films for recording head materials

S. Ikeda, Y. Uehara, I. Tagawa, N. Takeguchi, M. Kakehi

Research output: Contribution to journal › Conference article › peer-review

Abstract

The effects of additional elements, such as Al and O, on the magnetic and electrical properties of the Fe-N-Al-O films were studied. As a result, the relationship between soft magnetic properties and microstructure was established.

Original language	English
Pages (from-to)	CD-07
Journal	Digests of the Intermag Conference
Publication status	Published - 2000
Externally published	Yes
Event	2000 IEEE International Magnetics Conference-2000 IEEE INTERMAG - Toronto, Ont, Can Duration: 2000 Apr 9 → 2000 Apr 13

ASJC Scopus subject areas

Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Soft magnetic properties and microstructure of high moment Fe-N-Al-O films for recording head materials'. Together they form a unique fingerprint.

Cite this

@article{d825523bcdf04632bc6433f2a2af8adf,

title = "Soft magnetic properties and microstructure of high moment Fe-N-Al-O films for recording head materials",

abstract = "The effects of additional elements, such as Al and O, on the magnetic and electrical properties of the Fe-N-Al-O films were studied. As a result, the relationship between soft magnetic properties and microstructure was established.",

author = "S. Ikeda and Y. Uehara and I. Tagawa and N. Takeguchi and M. Kakehi",

year = "2000",

language = "English",

pages = "CD--07",

journal = "Digests of the Intermag Conference",

issn = "0074-6843",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2000 IEEE International Magnetics Conference-2000 IEEE INTERMAG ; Conference date: 09-04-2000 Through 13-04-2000",

}

TY - JOUR

T1 - Soft magnetic properties and microstructure of high moment Fe-N-Al-O films for recording head materials

AU - Ikeda, S.

AU - Uehara, Y.

AU - Tagawa, I.

AU - Takeguchi, N.

AU - Kakehi, M.

PY - 2000

Y1 - 2000

N2 - The effects of additional elements, such as Al and O, on the magnetic and electrical properties of the Fe-N-Al-O films were studied. As a result, the relationship between soft magnetic properties and microstructure was established.

AB - The effects of additional elements, such as Al and O, on the magnetic and electrical properties of the Fe-N-Al-O films were studied. As a result, the relationship between soft magnetic properties and microstructure was established.

UR - http://www.scopus.com/inward/record.url?scp=0033714901&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033714901&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0033714901

SP - CD-07

JO - Digests of the Intermag Conference

JF - Digests of the Intermag Conference

SN - 0074-6843

T2 - 2000 IEEE International Magnetics Conference-2000 IEEE INTERMAG

Y2 - 9 April 2000 through 13 April 2000

ER -