TY - GEN
T1 - Soft-delay-error evaluation in content-addressable memory
AU - Onizawa, Naoya
AU - Matsunaga, Shoun
AU - Sakimura, Noboru
AU - Nebashi, Ryusuke
AU - Sugibayashi, Tadahiko
AU - Hanyu, Takahiro
PY - 2014/1/1
Y1 - 2014/1/1
N2 - In this paper, a delay-variation effect under alpha-particle strikes is evaluated in content-addressable memories (CAMs). The particle strikes into transistors induce a current-pulse signal that causes the delay variation, resulting in a timing error, called a soft-delay error (SDE). The delay variations in two different CAMs designed in a 90nm CMOS technology are simulated in NS-SPICE using a charge-injection model that generates a current-pulse signal. The SDE effects are discussed, where one of the CAMs is a traditional 9-transistor-cell CAM and the other one is a magnetic-tunnel- junction (MTJ)/MOS hybrid CAM that operates based on a multiple-valued current-mode logic. The simulation results show that there is a trade-off between the amount of current (thus power dissipation) and the SDE effects in the MTJ/MOS hybrid CAM.
AB - In this paper, a delay-variation effect under alpha-particle strikes is evaluated in content-addressable memories (CAMs). The particle strikes into transistors induce a current-pulse signal that causes the delay variation, resulting in a timing error, called a soft-delay error (SDE). The delay variations in two different CAMs designed in a 90nm CMOS technology are simulated in NS-SPICE using a charge-injection model that generates a current-pulse signal. The SDE effects are discussed, where one of the CAMs is a traditional 9-transistor-cell CAM and the other one is a magnetic-tunnel- junction (MTJ)/MOS hybrid CAM that operates based on a multiple-valued current-mode logic. The simulation results show that there is a trade-off between the amount of current (thus power dissipation) and the SDE effects in the MTJ/MOS hybrid CAM.
KW - CAM
KW - associative memory
KW - magnetic-tunnel-junction (MTJ) device
KW - nonvolatile memory
KW - single-event upset (SEU)
KW - soft error
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U2 - 10.1109/ISMVL.2014.46
DO - 10.1109/ISMVL.2014.46
M3 - Conference contribution
AN - SCOPUS:84904468501
SN - 9781479935345
T3 - Proceedings of The International Symposium on Multiple-Valued Logic
SP - 220
EP - 225
BT - Proceedings - 2014 IEEE 44th International Symposium on Multiple-Valued Logic, ISMVL 2014
PB - IEEE Computer Society
T2 - 44th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2014
Y2 - 19 May 2014 through 21 May 2014
ER -