Soft-delay-error evaluation in content-addressable memory

Naoya Onizawa; Shoun Matsunaga; Noboru Sakimura; Ryusuke Nebashi; Tadahiko Sugibayashi; Takahiro Hanyu

doi:10.1109/ISMVL.2014.46

Soft-delay-error evaluation in content-addressable memory

Naoya Onizawa, Shoun Matsunaga, Noboru Sakimura, Ryusuke Nebashi, Tadahiko Sugibayashi, Takahiro Hanyu

Creative Interdisciplinary Research Division

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

In this paper, a delay-variation effect under alpha-particle strikes is evaluated in content-addressable memories (CAMs). The particle strikes into transistors induce a current-pulse signal that causes the delay variation, resulting in a timing error, called a soft-delay error (SDE). The delay variations in two different CAMs designed in a 90nm CMOS technology are simulated in NS-SPICE using a charge-injection model that generates a current-pulse signal. The SDE effects are discussed, where one of the CAMs is a traditional 9-transistor-cell CAM and the other one is a magnetic-tunnel- junction (MTJ)/MOS hybrid CAM that operates based on a multiple-valued current-mode logic. The simulation results show that there is a trade-off between the amount of current (thus power dissipation) and the SDE effects in the MTJ/MOS hybrid CAM.

Original language	English
Title of host publication	Proceedings - 2014 IEEE 44th International Symposium on Multiple-Valued Logic, ISMVL 2014
Publisher	IEEE Computer Society
Pages	220-225
Number of pages	6
ISBN (Print)	9781479935345
DOIs	https://doi.org/10.1109/ISMVL.2014.46
Publication status	Published - 2014 Jan 1
Event	44th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2014 - Bremen, Germany Duration: 2014 May 19 → 2014 May 21

Publication series

Name	Proceedings of The International Symposium on Multiple-Valued Logic
ISSN (Print)	0195-623X

Other

Other	44th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2014
Country/Territory	Germany
City	Bremen
Period	14/5/19 → 14/5/21

Keywords

CAM
associative memory
magnetic-tunnel-junction (MTJ) device
nonvolatile memory
single-event upset (SEU)
soft error

ASJC Scopus subject areas

Computer Science(all)
Mathematics(all)

Access to Document

10.1109/ISMVL.2014.46

Cite this

Onizawa, N., Matsunaga, S., Sakimura, N., Nebashi, R., Sugibayashi, T., & Hanyu, T. (2014). Soft-delay-error evaluation in content-addressable memory. In Proceedings - 2014 IEEE 44th International Symposium on Multiple-Valued Logic, ISMVL 2014 (pp. 220-225). [6845024] (Proceedings of The International Symposium on Multiple-Valued Logic). IEEE Computer Society. https://doi.org/10.1109/ISMVL.2014.46

Soft-delay-error evaluation in content-addressable memory. / Onizawa, Naoya; Matsunaga, Shoun; Sakimura, Noboru; Nebashi, Ryusuke; Sugibayashi, Tadahiko; Hanyu, Takahiro.

Proceedings - 2014 IEEE 44th International Symposium on Multiple-Valued Logic, ISMVL 2014. IEEE Computer Society, 2014. p. 220-225 6845024 (Proceedings of The International Symposium on Multiple-Valued Logic).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Onizawa, N, Matsunaga, S, Sakimura, N, Nebashi, R, Sugibayashi, T & Hanyu, T 2014, Soft-delay-error evaluation in content-addressable memory. in Proceedings - 2014 IEEE 44th International Symposium on Multiple-Valued Logic, ISMVL 2014., 6845024, Proceedings of The International Symposium on Multiple-Valued Logic, IEEE Computer Society, pp. 220-225, 44th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2014, Bremen, Germany, 14/5/19. https://doi.org/10.1109/ISMVL.2014.46

Onizawa N, Matsunaga S, Sakimura N, Nebashi R, Sugibayashi T, Hanyu T. Soft-delay-error evaluation in content-addressable memory. In Proceedings - 2014 IEEE 44th International Symposium on Multiple-Valued Logic, ISMVL 2014. IEEE Computer Society. 2014. p. 220-225. 6845024. (Proceedings of The International Symposium on Multiple-Valued Logic). https://doi.org/10.1109/ISMVL.2014.46

Onizawa, Naoya ; Matsunaga, Shoun ; Sakimura, Noboru ; Nebashi, Ryusuke ; Sugibayashi, Tadahiko ; Hanyu, Takahiro. / Soft-delay-error evaluation in content-addressable memory. Proceedings - 2014 IEEE 44th International Symposium on Multiple-Valued Logic, ISMVL 2014. IEEE Computer Society, 2014. pp. 220-225 (Proceedings of The International Symposium on Multiple-Valued Logic).

@inproceedings{f40033f340ee41c8a9cce3295bd1e581,

title = "Soft-delay-error evaluation in content-addressable memory",

abstract = "In this paper, a delay-variation effect under alpha-particle strikes is evaluated in content-addressable memories (CAMs). The particle strikes into transistors induce a current-pulse signal that causes the delay variation, resulting in a timing error, called a soft-delay error (SDE). The delay variations in two different CAMs designed in a 90nm CMOS technology are simulated in NS-SPICE using a charge-injection model that generates a current-pulse signal. The SDE effects are discussed, where one of the CAMs is a traditional 9-transistor-cell CAM and the other one is a magnetic-tunnel- junction (MTJ)/MOS hybrid CAM that operates based on a multiple-valued current-mode logic. The simulation results show that there is a trade-off between the amount of current (thus power dissipation) and the SDE effects in the MTJ/MOS hybrid CAM.",

keywords = "CAM, associative memory, magnetic-tunnel-junction (MTJ) device, nonvolatile memory, single-event upset (SEU), soft error",

author = "Naoya Onizawa and Shoun Matsunaga and Noboru Sakimura and Ryusuke Nebashi and Tadahiko Sugibayashi and Takahiro Hanyu",

year = "2014",

month = jan,

day = "1",

doi = "10.1109/ISMVL.2014.46",

language = "English",

isbn = "9781479935345",

series = "Proceedings of The International Symposium on Multiple-Valued Logic",

publisher = "IEEE Computer Society",

pages = "220--225",

booktitle = "Proceedings - 2014 IEEE 44th International Symposium on Multiple-Valued Logic, ISMVL 2014",

note = "44th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2014 ; Conference date: 19-05-2014 Through 21-05-2014",

}

TY - GEN

T1 - Soft-delay-error evaluation in content-addressable memory

AU - Onizawa, Naoya

AU - Matsunaga, Shoun

AU - Sakimura, Noboru

AU - Nebashi, Ryusuke

AU - Sugibayashi, Tadahiko

AU - Hanyu, Takahiro

PY - 2014/1/1

Y1 - 2014/1/1

N2 - In this paper, a delay-variation effect under alpha-particle strikes is evaluated in content-addressable memories (CAMs). The particle strikes into transistors induce a current-pulse signal that causes the delay variation, resulting in a timing error, called a soft-delay error (SDE). The delay variations in two different CAMs designed in a 90nm CMOS technology are simulated in NS-SPICE using a charge-injection model that generates a current-pulse signal. The SDE effects are discussed, where one of the CAMs is a traditional 9-transistor-cell CAM and the other one is a magnetic-tunnel- junction (MTJ)/MOS hybrid CAM that operates based on a multiple-valued current-mode logic. The simulation results show that there is a trade-off between the amount of current (thus power dissipation) and the SDE effects in the MTJ/MOS hybrid CAM.

AB - In this paper, a delay-variation effect under alpha-particle strikes is evaluated in content-addressable memories (CAMs). The particle strikes into transistors induce a current-pulse signal that causes the delay variation, resulting in a timing error, called a soft-delay error (SDE). The delay variations in two different CAMs designed in a 90nm CMOS technology are simulated in NS-SPICE using a charge-injection model that generates a current-pulse signal. The SDE effects are discussed, where one of the CAMs is a traditional 9-transistor-cell CAM and the other one is a magnetic-tunnel- junction (MTJ)/MOS hybrid CAM that operates based on a multiple-valued current-mode logic. The simulation results show that there is a trade-off between the amount of current (thus power dissipation) and the SDE effects in the MTJ/MOS hybrid CAM.

KW - CAM

KW - associative memory

KW - magnetic-tunnel-junction (MTJ) device

KW - nonvolatile memory

KW - single-event upset (SEU)

KW - soft error

UR - http://www.scopus.com/inward/record.url?scp=84904468501&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84904468501&partnerID=8YFLogxK

U2 - 10.1109/ISMVL.2014.46

DO - 10.1109/ISMVL.2014.46

M3 - Conference contribution

AN - SCOPUS:84904468501

SN - 9781479935345

T3 - Proceedings of The International Symposium on Multiple-Valued Logic

SP - 220

EP - 225

BT - Proceedings - 2014 IEEE 44th International Symposium on Multiple-Valued Logic, ISMVL 2014

PB - IEEE Computer Society

T2 - 44th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2014

Y2 - 19 May 2014 through 21 May 2014

ER -

Soft-delay-error evaluation in content-addressable memory

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