Smaller spot formation by vector beam for higher resolution microscopy

Shunichi Sato, Yuichi Kozawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Smaller spot formation by using vector beams is demonstrated for achieving higher lateral resolution, which is beyond conventional diffraction limit, in confocal microscopy, twophoton microscopy and subtraction microscopy.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationScience and Innovations, CLEO-SI 2015
PublisherOptical Society of America (OSA)
Number of pages1
ISBN (Electronic)9781557529688
DOIs
Publication statusPublished - 2015 May 4
EventCLEO: Science and Innovations, CLEO-SI 2015 - San Jose, United States
Duration: 2015 May 102015 May 15

Publication series

NameCLEO: Science and Innovations, CLEO-SI 2015

Other

OtherCLEO: Science and Innovations, CLEO-SI 2015
CountryUnited States
CitySan Jose
Period15/5/1015/5/15

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

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