Slit width measurement of a long precision slot die

Translated title of the contribution: Slit width measurement of a long precision slot die

Masaru Furukawa, Wei Gao, Hiroki Shimizu, Satoshi Kiyono, Mutsumi Yasutake, Kazuhiko Takahashi

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

This paper presents a CCD camera-based system for slit width measurement of long precision slot dies. The slit width is calculated from the binary image of the slit after positions of the two edges of the slit are determined through a least square linear fitting of the edge data. The resolution of the CCD camera is on the order of sub-microns, which satisfies the requirement of quality control of the slit width. Local slit width can also be obtained because of the small field of view of the CCD camera. The slit width over the entire slot die can be measured enough scanning the CCD camera. The influence of the Z-directional straightness of the scanning stage can be reduced by choosing a proper threshold for binarization of the CCD image. Experimental results have shown that the slit width over the entire length of a 1.4 m long slot die can be measured in 33 seconds.

Translated title of the contributionSlit width measurement of a long precision slot die
Original languageJapanese
Pages (from-to)1013-1017
Number of pages5
JournalSeimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering
Volume69
Issue number7
DOIs
Publication statusPublished - 2003 Jul
Externally publishedYes

ASJC Scopus subject areas

  • Mechanical Engineering

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