Size effects on exchange bias in polycrystalline Ni-Fe/Fe-Mn square dots

Isao Sasaki; Ryoichi Nakatani; Kazufumi Ishimoto; Yasushi Endo; Yu Shiratsuchi; Yoshio Kawamura; Masahiko Yamamoto

doi:10.1016/j.jmmm.2006.10.984

Size effects on exchange bias in polycrystalline Ni-Fe/Fe-Mn square dots

Isao Sasaki, Ryoichi Nakatani, Kazufumi Ishimoto, Yasushi Endo, Yu Shiratsuchi, Yoshio Kawamura, Masahiko Yamamoto

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

The effects of the dot size on the exchange bias in the Ni-Fe/Fe-Mn square dots have been investigated. The exchange bias field and the blocking temperature of the square dots decrease as the dot size decreases. We consider this behavior is because the spins are fluctuated by the thermal activation in the laterally constricted antiferromagnetic grains which are located at the edges of the dots.

Original language	English
Pages (from-to)	2677-2679
Number of pages	3
Journal	Journal of Magnetism and Magnetic Materials
Volume	310
Issue number	2 SUPPL. PART 3
DOIs	https://doi.org/10.1016/j.jmmm.2006.10.984
Publication status	Published - 2007 Mar 1
Externally published	Yes

Keywords

Antiferromagnetic layer
Exchange bias
MRAM
Nanostructure
Thermal fluctuation

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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Size effects on exchange bias in polycrystalline Ni-Fe/Fe-Mn square dots. / Sasaki, Isao; Nakatani, Ryoichi; Ishimoto, Kazufumi; Endo, Yasushi; Shiratsuchi, Yu; Kawamura, Yoshio; Yamamoto, Masahiko.

In: Journal of Magnetism and Magnetic Materials, Vol. 310, No. 2 SUPPL. PART 3, 01.03.2007, p. 2677-2679.

Research output: Contribution to journal › Article › peer-review

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abstract = "The effects of the dot size on the exchange bias in the Ni-Fe/Fe-Mn square dots have been investigated. The exchange bias field and the blocking temperature of the square dots decrease as the dot size decreases. We consider this behavior is because the spins are fluctuated by the thermal activation in the laterally constricted antiferromagnetic grains which are located at the edges of the dots.",

keywords = "Antiferromagnetic layer, Exchange bias, MRAM, Nanostructure, Thermal fluctuation",

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AU - Sasaki, Isao

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AU - Shiratsuchi, Yu

AU - Kawamura, Yoshio

AU - Yamamoto, Masahiko

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KW - Exchange bias

KW - MRAM

KW - Nanostructure

KW - Thermal fluctuation

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