Size effects on exchange bias in polycrystalline Ni-Fe/Fe-Mn square dots

Isao Sasaki, Ryoichi Nakatani, Kazufumi Ishimoto, Yasushi Endo, Yu Shiratsuchi, Yoshio Kawamura, Masahiko Yamamoto

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

The effects of the dot size on the exchange bias in the Ni-Fe/Fe-Mn square dots have been investigated. The exchange bias field and the blocking temperature of the square dots decrease as the dot size decreases. We consider this behavior is because the spins are fluctuated by the thermal activation in the laterally constricted antiferromagnetic grains which are located at the edges of the dots.

Original languageEnglish
Pages (from-to)2677-2679
Number of pages3
JournalJournal of Magnetism and Magnetic Materials
Volume310
Issue number2 SUPPL. PART 3
DOIs
Publication statusPublished - 2007 Mar 1
Externally publishedYes

Keywords

  • Antiferromagnetic layer
  • Exchange bias
  • MRAM
  • Nanostructure
  • Thermal fluctuation

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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