Site occupancy determination of Eu/Y doped in Ca2SnO4 phosphor by electron channeling microanalysis

S. Muto, Y. Fujimichi, K. Tatsumi, T. Kawano, H. Yamane

    Research output: Contribution to journalArticlepeer-review

    5 Citations (Scopus)

    Abstract

    Energy-dispersive X-ray analysis based on electron channeling effects in transmission electron microscopy (TEM) was performed on Ca2SnO 4 phosphor materials doped with Eu3+/Y3+ at various concentrations, which showed red photoluminescence associated with the Eu3+ 5D0-7F2 electric dipole transition. The method provided direct information on which host element site impurity elements occupy. The local atomic configurations and chemical bonding states associated with dopant impurities with different ionic radii were also examined by TEM-electron energy-loss spectroscopy (TEM-EELS).

    Original languageEnglish
    Pages (from-to)1015-1018
    Number of pages4
    JournalOptical Materials
    Volume33
    Issue number7
    DOIs
    Publication statusPublished - 2011 May

    Keywords

    • Electron channeling
    • Electron energy-loss spectroscopy
    • Energy-dispersive X-ray analysis
    • Rare-earth dopant
    • Transmission electron microscopy

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Spectroscopy
    • Physical and Theoretical Chemistry
    • Organic Chemistry
    • Inorganic Chemistry
    • Electrical and Electronic Engineering

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