SiO2/Si Interfaces studied by UHV-STM

Masaaki Niwa, Hiroshi Iwasaki, Hideyuki Tanaka, Isao Sumita

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)268-270
Number of pages3
JournalShinku
Volume34
Issue number3
DOIs
Publication statusPublished - 1991 Jan 1
Externally publishedYes

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

Cite this

Niwa, M., Iwasaki, H., Tanaka, H., & Sumita, I. (1991). SiO2/Si Interfaces studied by UHV-STM. Shinku, 34(3), 268-270. https://doi.org/10.3131/jvsj.34.268