Single-crystal X-ray diffraction study of SrGeO3 high-pressure perovskite phase at 100 K

Akihiko Nakatsuka, Hiroshi Arima, Osamu Ohtaka, Keiko Fujiwara, Akira Yoshiasa

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2 Citations (Scopus)


Single-crystal X-ray diffraction study of SrGeO3 perovskite (cubic; space group Pmm) synthesized at 6 GPa and 1223 K was conducted at a low temperature of 100 K. The residual electron density revealed the presence of the bonding electron at the center of the Ge-O bond, in accordance with our previous conclusion that the Ge-O bond is strongly covalent. From comparison with our previous structure-refinement result at 296 K, the mean square displacement (MSD) of the O atom in the direction of the Ge-O bond is suggested to exhibit no significant temperature dependence, in contrast to that in the direction perpendicular to the bond. Thus, the strong covalency of the Ge-O bond can have a large influence on the temperature dependence of thermal vibration of the O atom.

Original languageEnglish
Article number042015
JournalJournal of Physics: Conference Series
Issue number4
Publication statusPublished - 2017 Nov 7
EventJoint AIRAPT-25th and EHPRG-53rd International Conference on High Pressure Science and Technology - Madrid, Spain
Duration: 2015 Aug 302015 Sep 4

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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