TY - JOUR
T1 - Simultaneous observation of zone-axis pattern and ±g dark-field pattern in convergent-beam electron diffraction
AU - Terauchi, Masami
AU - Tanaka, Michiyoshi
N1 - Funding Information:
Acknowledgments. This work was partly supported by a Grant-in-Aid for Scientific Research from the Ministry of Education, Science and Culture, Japan.
PY - 1985/12
Y1 - 1985/12
N2 - A convergent-beam electron diffraction (CBED) technique to take the four patterns (whole pattern, bright-field, dark-field and ±G dark-field patterns) which are needed for crystal-point-group determination simultaneously on a film is described with ray path diagrams and obtained results. The technique enables us to obtain these patterns from a 100-nm diameter specimen area with less contamination and to set the exact Bragg angles at the centers of reflection disks. The present method Is compared with other techniques, especially with one previous technique EM. Terauchl and M. Tanaka: J. Electron Microsc., 34, 128 (1985)]. Some application results of the present technique to real crystals are demonstrated.
AB - A convergent-beam electron diffraction (CBED) technique to take the four patterns (whole pattern, bright-field, dark-field and ±G dark-field patterns) which are needed for crystal-point-group determination simultaneously on a film is described with ray path diagrams and obtained results. The technique enables us to obtain these patterns from a 100-nm diameter specimen area with less contamination and to set the exact Bragg angles at the centers of reflection disks. The present method Is compared with other techniques, especially with one previous technique EM. Terauchl and M. Tanaka: J. Electron Microsc., 34, 128 (1985)]. Some application results of the present technique to real crystals are demonstrated.
KW - Convergent-beam electron diffraction (CBED)
KW - Dark-field
KW - Point and space group determination
KW - Zone-axis pattern
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M3 - Article
AN - SCOPUS:77958399233
VL - 34
SP - 347
EP - 356
JO - Microscopy (Oxford, England)
JF - Microscopy (Oxford, England)
SN - 2050-5698
IS - 4
ER -