Simultaneous observation of nanometer size ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy

H. Odagawa, Y. Cho

Research output: Contribution to journalConference article

2 Citations (Scopus)

Abstract

A new type of scanning nonlinear dielectric microscope (SNDM), with an additional function of simultaneous observation of surface morphology, has been developed. This was achieved by using an electrically conducting atomic force microscopy cantilever as a probe needle. Using this new SNDM, simultaneous measurements of several ferroelectric materials, such as periodically polarized LiNbO3 and PZT thin films on SrTiO3 substrates, were performed. Topographic and domain images, which were simultaneously taken from the same location of the materials, were successfully obtained. The result shows that nano-sized ferroelectric domain with the width of 1.5 nm for PZT thin film having a good correlation with a topographic image were observed. Moreover ferroelectric writing and reading are demonstrated using the SNDM system.

Original languageEnglish
Pages (from-to)29-36
Number of pages8
JournalFerroelectrics
Volume251
Issue number1-4
DOIs
Publication statusPublished - 2001 Jan 1
Event6th International Symposium on Ferroic Domains and Mesoscopic Structures (ISFD-6) - Nanjing, China
Duration: 2000 May 292000 Jun 2

Keywords

  • Atomic force microscope
  • Determination of polarization
  • Ferroelectric materials
  • Ferroelectric recording
  • Nanometer size ferroelectric domain
  • Scanning nonlinear dielectric microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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