Simultaneous observation of nano-sized ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy

H. Odagawa, Yasuo Cho

Research output: Contribution to journalArticlepeer-review

62 Citations (Scopus)

Abstract

A new type of scanning nonlinear dielectric microscope (SNDM), with an additional function of simultaneous observation of surface morphology, has been developed. This was achieved by using an electrically conducting atomic force microscopy cantilever as a probe needle. Using this new SNDM, simultaneous measurements of several ferroelectric materials, such as LiNbO3 single crystal and lead zirconate titanate (PZT) thin films on SrTiO3 substrates, were performed. Topographic and domain images, which were simultaneously taken from the same location on the materials, were successfully obtained. The result shows that nano-sized ferroelectric 180° c-c domains of PZT thin film having a good correlation with a topographic image were observed.

Original languageEnglish
JournalSurface Science
Volume463
Issue number1
DOIs
Publication statusPublished - 2000 Aug 20

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Simultaneous observation of nano-sized ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy'. Together they form a unique fingerprint.

Cite this