Simultaneous observation of ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy

H. Odagawa, Y. Cho

Research output: Contribution to conferencePaperpeer-review

Abstract

A new type of scanning nonlinear dielectric microscope (SNDM), with an additional function of simultaneous observation of surface morphology, has been developed. This was achieved by using an electrically conducting atomic force microscopy cantilever as a probe needle. Using this new SNDM, simultaneous measurements of several ferroelectric materials, such as periodically polarized LiNbO3 and PZT thin films on SrTiO3 substrates, were performed. Topographic and domain images, which were simultaneously taken from the same location of the materials, were successfully obtained. The result shows that nano-sized ferroelectric domain with the width of 1.5 nm for PZT thin film having a good correlation with a topographic image were observed.

Original languageEnglish
Pages987-990
Number of pages4
Publication statusPublished - 2000 Dec 1
Event12th IEEE International Symposium on Applications of Ferroelectrics - Honolulu, HI, United States
Duration: 2000 Jul 212000 Aug 2

Other

Other12th IEEE International Symposium on Applications of Ferroelectrics
CountryUnited States
CityHonolulu, HI
Period00/7/2100/8/2

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Simultaneous observation of ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy'. Together they form a unique fingerprint.

Cite this