Simultaneous observation of ferroelectric domain patterns by scanning nonlinear dielectric microscope and surface morphology by atomic force microscope

Hiroyuki Odagawa, Yasuo Cho, Hiroshi Funakubo, Kuniharu Nagashima

Research output: Contribution to journalArticlepeer-review

23 Citations (Scopus)

Abstract

A new type of scanning nonlinear dielectric microscope (SNDM), with an additional function of simultaneous observations of surface morphology, has been developed. This was achieved by employing an electrically conducting atomic force microscopy cantilever as a probe needle. Using this new SNDM, simultaneous measurements of several ferroelectric materials, such as lead zirconate titanate (PZT) thin films on both SrTiO3 and MgO substrates, were performed. Topographic and domain images were simultaneously obtained from the same location on the materials. Finally, the resolution of the SNDM was theoretically calculated and it was revealed that atomic scale resolution is possible using the SNDM technique.

Original languageEnglish
Pages (from-to)3808-3810
Number of pages3
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume39
Issue number6 B
Publication statusPublished - 2000 Dec 1

Keywords

  • Atomic force microscope
  • Determination of polarization
  • Ferroelectric materials
  • Scanning nonlinear dielectric microscopy

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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