SIMULTANEOUS LOCAL CAPACITANCE-VOLTAGE PROFILING AND DEEP LEVEL TRANSIENT SPECTROSCOPY USING TIME-RESOLVED SCANNING NONLINEAR DIELECTRIC MICROSCOPY

Yasuo Cho

SIMULTANEOUS LOCAL CAPACITANCE-VOLTAGE PROFILING AND DEEP LEVEL TRANSIENT SPECTROSCOPY USING TIME-RESOLVED SCANNING NONLINEAR DIELECTRIC MICROSCOPY

Yasuo Cho

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English
Pages (from-to)	17-29
Number of pages	13
Journal	Electronic Device Failure Analysis
Volume	24
Issue number	1
Publication status	Published - 2022

ASJC Scopus subject areas

Safety, Risk, Reliability and Quality
Electrical and Electronic Engineering

Cite this

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title = "SIMULTANEOUS LOCAL CAPACITANCE-VOLTAGE PROFILING AND DEEP LEVEL TRANSIENT SPECTROSCOPY USING TIME-RESOLVED SCANNING NONLINEAR DIELECTRIC MICROSCOPY",

author = "Yasuo Cho",

year = "2022",

language = "English",

volume = "24",

pages = "17--29",

journal = "Electronic Device Failure Analysis",

issn = "1537-0755",

publisher = "ASM International",

number = "1",

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AU - Cho, Yasuo

PY - 2022

Y1 - 2022

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SN - 1537-0755

VL - 24

SP - 17

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JO - Electronic Device Failure Analysis

JF - Electronic Device Failure Analysis

IS - 1

ER -

SIMULTANEOUS LOCAL CAPACITANCE-VOLTAGE PROFILING AND DEEP LEVEL TRANSIENT SPECTROSCOPY USING TIME-RESOLVED SCANNING NONLINEAR DIELECTRIC MICROSCOPY

ASJC Scopus subject areas

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