TY - JOUR
T1 - Simultaneous analysis of total reflection x-ray diffraction and fluorescence from copper-phthalocyanine thin films during evaporation process
AU - Hayashi, Koichi
AU - Horiuchi, Toshihisa
AU - Matsushige, Kazumi
PY - 1995/1/1
Y1 - 1995/1/1
N2 - A newly developed X-ray measuring system, capable of simultaneously conducting total-reflection X-ray diffraction (TXRD) and total-reflection X-ray fluorescence (TXRF) analyses, was utilized to follow the adsorption and structural changes in copper phthalocyanine (CuPc) thin films during an evaporation process. The intensities of Cu Kα fluorescent X-rays provided precise data on the amount of CuPc molecules adsorbed on the substrate of SiO2, and thus the difference in adsorption coefficient of CuPc molecules on the SiO2substrate and the oscillator surfaces of Ag could be evaluated in the first place. Moreover, by combining these fluorescent data with the diffraction data we could follow the exact changes of molecular orientation with the increase of film thickness. The data on the film thickness variations of the X-ray profiles revealed that the structural change in the CuPc molecular crystal occurred at about 9 nm thickness of the evaporated film.
AB - A newly developed X-ray measuring system, capable of simultaneously conducting total-reflection X-ray diffraction (TXRD) and total-reflection X-ray fluorescence (TXRF) analyses, was utilized to follow the adsorption and structural changes in copper phthalocyanine (CuPc) thin films during an evaporation process. The intensities of Cu Kα fluorescent X-rays provided precise data on the amount of CuPc molecules adsorbed on the substrate of SiO2, and thus the difference in adsorption coefficient of CuPc molecules on the SiO2substrate and the oscillator surfaces of Ag could be evaluated in the first place. Moreover, by combining these fluorescent data with the diffraction data we could follow the exact changes of molecular orientation with the increase of film thickness. The data on the film thickness variations of the X-ray profiles revealed that the structural change in the CuPc molecular crystal occurred at about 9 nm thickness of the evaporated film.
KW - Adsorption coefficient
KW - Copper phthalocyanine
KW - Evaporation
KW - In-plane X-ray diffraction
KW - In-situ observation
KW - Molecular orientation
KW - Organic thin film
KW - X-ray fluorescence
KW - X-ray total reflection
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U2 - 10.1143/JJAP.34.6478
DO - 10.1143/JJAP.34.6478
M3 - Article
AN - SCOPUS:0029528678
VL - 34
SP - 6478
EP - 6482
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 12
ER -