Simulations of the effects of tip apex geometries on atomic force microscopy images

Masaharu Komiyama, Katsuyuki Tazawa, Kazuya Tsujimichi, Akiyasu Hirotani, Momoji Kubo, Akira Miyamoto

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Simulation works on the effects of tip apex geometries on atomic force microscopy (AFM) images were examined. Tips and samples employed in those simulations were mostly made of a single component. Short-range interatomic potentials such as Lennard-Jones and Morse were used. With these potentials, it was found that a single atom tip (a tip with an atom protruding at its apex) is necessary for obtaining true atomic resolution. In many cases flat tip geometries (tips with multiple atoms at their apexes) produce various images that do not correspond to the surface atom arrangements, which may lead to various faulty AFM image interpretations.

Original languageEnglish
Pages (from-to)4101-4104
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume35
Issue number7
DOIs
Publication statusPublished - 1996 Jul

Keywords

  • Atomic force microscopy
  • Simulation
  • Tip apex geometry
  • Tip-sample distance

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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