Abstract
To evaluate attainable spatial resolution of phase-contrast X-ray imaging using an LLL X-ray interferometer with a thin crystal wafer, a computer simulation study with Takagi-Taupin equation was performed. Modulation transfer function of the wafer for X-ray phase was evaluated. For a polyester film whose thickness is 0.1 mm, it was concluded that the spatial resolution can be improved up to 3 μm by thinning the wafer, under our experimental condition.
Original language | English |
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Pages (from-to) | 446-450 |
Number of pages | 5 |
Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 199 |
DOIs | |
Publication status | Published - 2003 Jan 1 |
Externally published | Yes |
Keywords
- Phase contrast
- Spatial resolution
- Takagi-Taupin equation
- X-ray interferometer
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Instrumentation