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Simulation study for the higher sensitivity of an electron-tracking compton camera at over 1 MeV
A. Takada, T. Tanimori, H. Kubo, K. Miuchi, S. Kabuki, J. D. Parker, Y. Kishimoto, T. Mizumoto, K. Ueno, S. Kurosawa, S. Iwaki, T. Sawano, K. Taniue, K. Nakamura, N. Higashi, Y. Matsuoka, S. Komura, Y. Sato
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
1
Citation
(Scopus)