Simulation study for the higher sensitivity of an electron-tracking compton camera at over 1 MeV

A. Takada, T. Tanimori, H. Kubo, K. Miuchi, S. Kabuki, J. D. Parker, Y. Kishimoto, T. Mizumoto, K. Ueno, S. Kurosawa, S. Iwaki, T. Sawano, K. Taniue, K. Nakamura, N. Higashi, Y. Matsuoka, S. Komura, Y. Sato

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

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